Reference-Plane Invariant Free Space Dielectric Material Characterization up to 330 GHz.
| dc.centro | E.T.S.I. Telecomunicación | es_ES |
| dc.contributor.author | Moreno-Rodríguez, Salvador | |
| dc.contributor.author | Pérez-Escribano, Mario | |
| dc.contributor.author | Ortiz Ruiz, Sergio | |
| dc.contributor.author | Alex-Amor, Antonio | |
| dc.contributor.author | Plaza-Gallardo, Borja | |
| dc.contributor.author | García-Ruiz, Francisco J. | |
| dc.contributor.author | Molero, Carlos | |
| dc.date.accessioned | 2024-05-03T11:12:36Z | |
| dc.date.available | 2024-05-03T11:12:36Z | |
| dc.date.issued | 2024 | |
| dc.departamento | Ingeniería de Comunicaciones | |
| dc.description.abstract | This paper describes the process followed to implement a system to characterize the complex permittivity of materials in the 10-330 GHz frequency band. Firstly, the method used and the system's calibration process are shown, consisting of a double calibration TRL (Thru-Reflect-Line) and GRL (Gated-Reflect-Line). Subsequently, a smoothing technique is used to improve the accuracy of the results. Finally, a test is performed on quartz and glass fiber samples, showing that the results are quite reliable over the entire measured bandwidth. | es_ES |
| dc.description.sponsorship | Universidad de Málaga. Campus de Excelencia Internacional Andalucía Tech. | es_ES |
| dc.identifier.uri | https://hdl.handle.net/10630/31201 | |
| dc.language.iso | eng | es_ES |
| dc.relation.eventdate | Mayo de 2024 | es_ES |
| dc.relation.eventplace | Gran Canaria, España | es_ES |
| dc.relation.eventtitle | 4th URSI AT-RASC | es_ES |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internacional | * |
| dc.rights.accessRights | open access | es_ES |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
| dc.subject | Relajación dieléctrica | es_ES |
| dc.subject | Materiales | es_ES |
| dc.subject.other | Material | es_ES |
| dc.subject.other | Characterization | es_ES |
| dc.title | Reference-Plane Invariant Free Space Dielectric Material Characterization up to 330 GHz. | es_ES |
| dc.type | conference output | es_ES |
| dspace.entity.type | Publication | |
| relation.isAuthorOfPublication | 015bdc2d-3506-44f6-ace7-0f343d2607a8 | |
| relation.isAuthorOfPublication.latestForDiscovery | 015bdc2d-3506-44f6-ace7-0f343d2607a8 |
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