Single-shot laser-ionization mass spectrometry for direct atomic analysis

Abstract

Direct laser ionization of solids (LIMS, laser-ionization mass spectrometry) represents a powerful way to get full atomic information about sample microlocations. Spatial resolutions as low a few microns are easily attainable with conventional optics, with vaporized mass in the low femtogram per pulse range. Considering the lack of limitations with respect to sample type, it is clear that the only limitation of the technique relies on his poor reproducibility and moderate sensitivity. The talk talk will cover several fundamental and applied aspects of LIMS to fit the technique in a proper frame of comparison with other techniques