RT Conference Proceedings
T1 Estimating Reliability of Telecommunication and Electronic Devices
A1 Aamir, Muhammad
K1 Electrónica Aparatos e instrumentos
AB This talk mainly focused on understanding of reliability parameters such as Mean Time Between Failures (MTBF) and Mean Time To Repair (MTTR). These parameters are further explored for estimation of reliability with special reference to Telecommunication and electronic devices. This talk is being augmented by adding few practical analyses of interest. Moreover, the topic is also linked with electronic design automation considering concept of Built In Self Test (BIST) for electronic chips and circuits based systems containing Telecommunication and electronic devices.
YR 2015
FD 2015-12-17
LK http://hdl.handle.net/10630/10834
UL http://hdl.handle.net/10630/10834
LA eng
NO Universidad de Málaga. Campus de Excelencia Internacional Andalucía Tech
DS RIUMA. Repositorio Institucional de la Universidad de Málaga
RD 21 ene 2026