2026-06-01T19:54:04Zhttps://riuma.uma.es/rest/oai/requestoai:riuma.uma.es:10630/121142026-02-03T12:24:55Zcom_10630_2254col_10630_37959
RIUMA. Repositorio Institucional de la Universidad de Málaga
author
Vadillo-Pérez, José Miguel
author
Druce, John
author
Ishihara, Tatsumi
author
Kilner, John
author
Téllez, Helena
2016-09-28T09:22:33Z
2016-09-28T09:22:33Z
2016-09-28
http://hdl.handle.net/10630/12114
http://orcid.org/0000-0002-8134-7318
Surface-sensitive ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and Low-Energy Ion Scattering (LEIS), are making significant contributions to further our understanding of the materials’ performance and the degradation processes that occur under operating conditions. In this contribution, we explore how recent instrumental developments and analytical approaches have boosted the application of these powerful techniques for the characterization of surfaces and interfaces in energy conversion and storage devices.
eng
by-nc-nd
Energía -- Conversión directa
Guiding the Development of Efficient and Durable Electrodes for Electrochemical Energy Conversion Applications through Advanced Ion Beam Analysis
conference output
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URL
https://riuma.uma.es/bitstreams/05c38744-8c6a-4fd3-bac5-753c80bbcbbd/download
File
MD5
0af11d53f34c1f857034d9fbe43db700
46461
application/pdf
Talk SIMS Final Program.pdf