2026-06-02T14:52:35Zhttps://riuma.uma.es/rest/oai/request

oai:riuma.uma.es:10630/121142026-02-03T12:24:55Zcom_10630_2254col_10630_37959

Vadillo-Pérez, José Miguel Druce, John Ishihara, Tatsumi Kilner, John Téllez, Helena 2016-09-28T09:22:33Z 2016-09-28T09:22:33Z 2016-09-28 http://hdl.handle.net/10630/12114 http://orcid.org/0000-0002-8134-7318 Surface-sensitive ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and Low-Energy Ion Scattering (LEIS), are making significant contributions to further our understanding of the materials’ performance and the degradation processes that occur under operating conditions. In this contribution, we explore how recent instrumental developments and analytical approaches have boosted the application of these powerful techniques for the characterization of surfaces and interfaces in energy conversion and storage devices. eng open access by-nc-nd Energía -- Conversión directa Guiding the Development of Efficient and Durable Electrodes for Electrochemical Energy Conversion Applications through Advanced Ion Beam Analysis conference output