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      <dc:title>Super-resolution of 3D Magnetic Resonance Images by Random Shifting and Convolutional Neural Networks</dc:title>
      <dc:creator>Thurnhofer Hemsi, Karl</dc:creator>
      <dc:creator>López-Rubio, Ezequiel</dc:creator>
      <dc:creator>Roé-Vellvé, Núria</dc:creator>
      <dc:creator>Domínguez-Merino, Enrique</dc:creator>
      <dc:creator>Molina-Cabello, Miguel Ángel</dc:creator>
      <dc:subject>Redes neuronales (Informática)</dc:subject>
      <dc:description>Enhancing resolution is a permanent goal in magnetic resonance (MR) imaging, in order to keep improving diagnostic capability and registration methods. Super-resolution (SR) techniques are applied at the postprocessing stage, and their use and development have progressively increased during the last years. In particular, example-based methods have been mostly proposed in recent state-of-the-art works. In this paper, a combination of a deep-learning SR system and a random shifting technique to improve the quality of MR images is proposed, implemented and tested. The model was compared to four competitors: cubic spline interpolation, non-local means upsampling, low-rank total variation and a three-dimensional convolutional neural network trained with patches of HR brain images (SRCNN3D). The newly proposed method showed better results in Peak Signal-to-Noise Ratio, Structural Similarity index, and Bhattacharyya coefficient. Computation times were at the&#xd;
same level as those of these up-to-date methods. When applied to downsampled MR structural T1 images, the new method also yielded better qualitative results, both in the restored images and in the images of residuals.</dc:description>
      <dc:date>2018-07-20T09:56:27Z</dc:date>
      <dc:date>2018-07-20T09:56:27Z</dc:date>
      <dc:date>2018</dc:date>
      <dc:type>journal article</dc:type>
      <dc:identifier>https://hdl.handle.net/10630/16321</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:relation>2018 IEEE World Congress on Computational Intelligence</dc:relation>
      <dc:relation>Río de Janeiro, Brasil</dc:relation>
      <dc:relation>Julio de 2018</dc:relation>
      <dc:rights>open access</dc:rights>
      <dc:publisher>IEEE</dc:publisher>
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