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      <dc:title>Designing polarization management devices by tilting subwavelength grating structures</dc:title>
      <dc:creator>Luque-González, José Manuel</dc:creator>
      <dc:creator>Herrero-Bermello, Alaine</dc:creator>
      <dc:creator>Ortega-Moñux, Alejandro</dc:creator>
      <dc:creator>Molina-Fernández, Íñigo</dc:creator>
      <dc:creator>Velasco, Aitor V.</dc:creator>
      <dc:creator>Cheben, Pavel</dc:creator>
      <dc:creator>Schmid, Jens H.</dc:creator>
      <dc:creator>Wang, Shurui</dc:creator>
      <dc:creator>Halir, Robert</dc:creator>
      <dc:subject>Optica integrada</dc:subject>
      <dc:subject>Materiales ópticos</dc:subject>
      <dc:subject>Metamateriales</dc:subject>
      <dc:description>Subwavelength gratings (SWG) are periodic structures which behave as controllable homogeneous metamaterials.&#xd;
SWGs are extremely interesting when they are used in platforms with a limited choice of material refractive&#xd;
indices, enabling the design of a myriad of high-performance devices. Here we present a novel technique to&#xd;
gain control over the intrinsic anisotropy of the synthesized metamaterial. We show that tilting the silicon&#xd;
segments in a SWG structure mainly affects the in-plane (TE) modes, with little impact on the out-of-plane&#xd;
(TM) modes. Moreover, we present a methodology to quickly but accurately calculate the modes of a tilted&#xd;
periodic structure modeling the structure as a rotated uniaxial crystal which can be solved with an anisotropic&#xd;
mode solver. Measurements on a set of fabricated tilted SWG waveguides validate our simulation results. By&#xd;
using the presented technique, we design a polarization beam splitter based on a 2x2 multimode interferometer.&#xd;
The design is based on the optimization of the tilting angle to tone the beat length of the TE modes to be a half&#xd;
of the beat length of the TM modes.</dc:description>
      <dc:date>2019-05-03T06:28:06Z</dc:date>
      <dc:date>2019-05-03T06:28:06Z</dc:date>
      <dc:date>2019</dc:date>
      <dc:date>2019-05-03</dc:date>
      <dc:type>conference output</dc:type>
      <dc:identifier>https://hdl.handle.net/10630/17610</dc:identifier>
      <dc:language>eng</dc:language>
      <dc:relation>SPIE Optics + Optoelectronics</dc:relation>
      <dc:relation>Praga, República Checa</dc:relation>
      <dc:relation>1-4 de abril de 2019</dc:relation>
      <dc:rights>open access</dc:rights>
   </ow:Publication>
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