<?xml version="1.0" encoding="UTF-8"?><?xml-stylesheet type="text/xsl" href="static/style.xsl"?><OAI-PMH xmlns="http://www.openarchives.org/OAI/2.0/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/ http://www.openarchives.org/OAI/2.0/OAI-PMH.xsd"><responseDate>2026-05-28T16:48:16Z</responseDate><request verb="GetRecord" identifier="oai:riuma.uma.es:10630/25132" metadataPrefix="qdc">https://riuma.uma.es/rest/oai/request</request><GetRecord><record><header><identifier>oai:riuma.uma.es:10630/25132</identifier><datestamp>2026-02-03T12:17:25Z</datestamp><setSpec>com_10630_2254</setSpec><setSpec>col_10630_37959</setSpec></header><metadata><qdc:qualifieddc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:dcterms="http://purl.org/dc/terms/" xmlns:doc="http://www.lyncode.com/xoai" xmlns:qdc="http://dspace.org/qualifieddc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://purl.org/dc/elements/1.1/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dc.xsd http://purl.org/dc/terms/ http://dublincore.org/schemas/xmls/qdc/2006/01/06/dcterms.xsd http://dspace.org/qualifieddc/ http://www.ukoln.ac.uk/metadata/dcmi/xmlschema/qualifieddc.xsd">
   <dc:title>Mitigating reflections in integrated gas sensors</dc:title>
   <dc:creator>Torres-Cubillo, Antonia</dc:creator>
   <dc:creator>Wanguemert-Pérez, Juan Gonzalo</dc:creator>
   <dc:creator>Sánchez-Postigo, Alejandro</dc:creator>
   <dc:creator>Molina-Fernández, Íñigo</dc:creator>
   <dc:creator>Halir, Robert</dc:creator>
   <dc:subject>Detectores ópticos - Congresos</dc:subject>
   <dc:subject>Detectores de gases - Congresos</dc:subject>
   <dc:subject>Óptica electrónica - Congresos</dc:subject>
   <dcterms:abstract>Optical gas sensing for environmental monitoring has become an active research topic in&#xd;
the last decade. Among the different optical sensing configurations, silicon photonic&#xd;
integrated sensors stand as a compact, CMOS-compatible alternative. However, even&#xd;
small on-chip reflections can create significant fringes when the optical path length is&#xd;
varied, e.g., when the wavelength is swept for TDLAS-like measurements. These fringes&#xd;
can be critical for NIR sensors, as absorption signals are much weaker in this region than&#xd;
in the MIR. Here, we propose a signal-processing method based on minimum phase&#xd;
techniques: by increasing the measurement bandwidth to around 2 nm we can&#xd;
completely remove the reflection artifacts through processing.</dcterms:abstract>
   <dcterms:dateAccepted>2022-09-28T09:39:05Z</dcterms:dateAccepted>
   <dcterms:available>2022-09-28T09:39:05Z</dcterms:available>
   <dcterms:created>2022-09-28T09:39:05Z</dcterms:created>
   <dcterms:issued>2022-09-07</dcterms:issued>
   <dc:type>conference output</dc:type>
   <dc:identifier>https://hdl.handle.net/10630/25132</dc:identifier>
   <dc:language>eng</dc:language>
   <dc:relation>Norwegian Electro-Optics Meeting</dc:relation>
   <dc:relation>Roros</dc:relation>
   <dc:relation>7-9 septiembre 2022</dc:relation>
   <dc:rights>open access</dc:rights>
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