Listar por autor "Vadillo, Jose"

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Guiding the Development of Efficient and Durable Electrodes for Electrochemical Energy Conversion Applications through Advanced Ion Beam Analysis

Vadillo, Jose; Druce, John; Ishihara, Tatsumi; Kilner, John; Téllez, Helena (2016-09-28)

Surface-sensitive ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and Low-Energy Ion Scattering (LEIS), are making significant contributions to further our understanding of the materials’ performance ...
Laser ionization mass spectrometry is not the poor man`s ICPMS

Vadillo, Jose; Medina, Samara; Laserna-Vázquez, José Javier (2016-09-28)

Laser ionization mass spectrometry includes in a broad sense, any laser-based technique capable of generating ions by the direct action of a pulsed laser over a solid sample. Over a certain laser energy, LIMS allows the ...