Listar por autor "Xin, Cheng"

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Error analysis and correction for quantitative phase analysis based on Rietveld-internal method: Whether the minor phases can be ignored?

Zhao, Piqi; Lu, Lingchao; Liu, Xianping; Gómez-de-la-Torre, María de los Ángeles; Xin, Cheng (MDPI, 2018-02)

The Rietveld-internal standard method for Bragg-Brentano reflection geometry (q/2q) X-ray diffraction (XRD) patterns is implemented to determine the amorphous phase content. The effect of some minor phases on quantitative ...