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dc.contributor.authorVadillo-Perez, Jose Miguel 
dc.contributor.authorDruce, John
dc.contributor.authorIshihara, Tatsumi
dc.contributor.authorKilner, John
dc.contributor.authorTéllez, Helena
dc.date.accessioned2016-09-28T09:22:33Z
dc.date.available2016-09-28T09:22:33Z
dc.date.created2016
dc.date.issued2016-09-28
dc.identifier.urihttp://hdl.handle.net/10630/12114
dc.description.abstractSurface-sensitive ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and Low-Energy Ion Scattering (LEIS), are making significant contributions to further our understanding of the materials’ performance and the degradation processes that occur under operating conditions. In this contribution, we explore how recent instrumental developments and analytical approaches have boosted the application of these powerful techniques for the characterization of surfaces and interfaces in energy conversion and storage devices.es_ES
dc.description.sponsorshipUniversidad de Málaga. Campus de Excelencia Internacional Andalucía Tech.es_ES
dc.language.isoenges_ES
dc.rightsinfo:eu-repo/semantics/openAccesses_ES
dc.subjectEnergía -- Conversión directaes_ES
dc.subject.otherIon beam analysises_ES
dc.subject.otherEnergy conversiones_ES
dc.titleGuiding the Development of Efficient and Durable Electrodes for Electrochemical Energy Conversion Applications through Advanced Ion Beam Analysises_ES
dc.typeinfo:eu-repo/semantics/conferenceObjectes_ES
dc.centroFacultad de Cienciases_ES
dc.relation.eventtitleSciX 2016es_ES
dc.relation.eventplaceMinneapolis, USAes_ES
dc.relation.eventdate18 septiembre 2016es_ES
dc.identifier.orcidhttp://orcid.org/0000-0002-8134-7318es_ES
dc.cclicenseby-nc-ndes_ES


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