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dc.contributor.authorZhao, Piqi
dc.contributor.authorLiu, Xianping
dc.contributor.authorDe la Torre, Angeles G.
dc.contributor.authorLu, Lingchao
dc.contributor.authorSobolev, Konstantin
dc.date.accessioned2018-07-10T07:01:26Z
dc.date.available2018-07-10T07:01:26Z
dc.date.issued2017
dc.identifier.citationAnal. Methods, 2017, 9, 2415en_US
dc.identifier.urihttps://hdl.handle.net/10630/16171
dc.description.abstractAn internal standard method based on Rietveld/XRD whole-pattern fitting analysis of fly ash is used to assess the quantitative accuracy to determine its crystalline and amorphous phases under various conditions such as internal standards (types, SiO2 or Al2O3 and dosages, 10–50%), incident X-rays (laboratory or synchrotron) and refinement software (GSAS or TOPAS). The results reveal that the quantitative stability is quite sensible to minor phases, identical to the internal standard, in fly ash. Errors positively correlate with the weight fraction of that minor phase and negatively correlate with the dosage of an internal standard and amorphous phase content in fly ash. The original equation for the amorphous phase calculation is not applicable for a case with a higher inherent quartz content (>2.5%) in fly ash while the dosages of the internal standard is lower than 20%. The original equation is modified as proposed. Based on it, the quantitative results of five different patterns report a good reproducibility with the arithmetic mean errors and the standard errors of identified main phases of around 1%.en_US
dc.description.sponsorshipThe access to the beamline BL14B1 facilities at the SSRF is appreciated and the support of SSRF management, User Office and beamline staff is highly appreciated. This Research is supported by the National Natural Science Foundation of China (No. 51602126), the National Key Research and Development Plan of China (2016YFB0303505) and the Program for Scientic Research Innovation Team in Colleges and Universities of Shandong Province.en_US
dc.language.isospaen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectRayos X - Difracciónen_US
dc.subject.otherRietveld methoden_US
dc.subject.otherAmorphousen_US
dc.titleAssessment of the quantitative accuracy of Rietveld/XRD analysis of crystalline and amorphous phases in fly ashen_US
dc.typeinfo:eu-repo/semantics/preprinten_US
dc.centroFacultad de Cienciasen_US
dc.identifier.doi10.1039/c7ay00337d
dc.rights.ccAttribution-NonCommercial-NoDerivatives 4.0 Internacional*


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Attribution-NonCommercial-NoDerivatives 4.0 Internacional
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