Listar QA - Contribuciones a congresos científicos por autor "Druce, John"

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Guiding the Development of Efficient and Durable Electrodes for Electrochemical Energy Conversion Applications through Advanced Ion Beam Analysis

Vadillo-Perez, Jose Miguel; Druce, John; Ishihara, Tatsumi; Kilner, John; Téllez, Helena (2016-09-28)

Surface-sensitive ion beam techniques, such as Secondary Ion Mass Spectrometry (SIMS) and Low-Energy Ion Scattering (LEIS), are making significant contributions to further our understanding of the materials’ performance ...